On Thursday November 5th and Friday November 6th, 2020 NIST will present a free-to-attend virtual conference where NIST scientists will discuss how they are using advanced methods in metrology, computer science and statistics to strengthen forensic science. Registration is available here.
Topic Areas to be covered:
- Statistical Methods in Forensic Science
- Firearms and Tool Marks
- Forensic Genetics
- Digital and Multimedia
Attendees will have the opportunity to submit questions during a virtual Q&A.